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Risk assessment practices at NASA: studies of design andreview methods. L. P. Chao, I. Y. Tumer, K. Ishii, and F. Barrientos. In ASME Design for Manufacturing Conference, Long Beach, CA, 2005. In review
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@inproceedings{chao05b, author = {L. P. Chao and I. Y. Tumer and K. Ishii and F. Barrientos}, title ={ Risk assessment practices at NASA: studies of design and review methods}, booktitle = {ASME Design for Manufacturing Conference}, address = {Long Beach, CA}, note={In review}, bib2html_pubtype = {Refereed Conference}, bib2html_rescat = {Design Methodology, Risk Based Design}, year = {2005} }
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