Irem Y. Tumer's Publications

• Sorted by Date • Classified by Publication Type • Classified by Research Category •

Comparing two levels of functional detail for mapping historical failures: you are only as good as your knowledge base

Comparing two levels of functional detail for mapping historical failures: you are only as good as your knowledge base. M. E. Stock, R. B. Stone, and I. Y. Tumer. In ASME International Mechanical Engineering Congress and Exposition, Washington, D.C., November 2003.

Download

(unavailable)

Abstract

(unavailable)

BibTeX Entry

@inproceedings{stock03b,
author = {M. E. Stock and R. B. Stone and I. Y. Tumer}, 
title ={Comparing two levels of functional detail for mapping historical failures: you are only as good as your knowledge base}, 
booktitle ={ASME International Mechanical Engineering Congress and Exposition}, 
volume ={IMECE2003-41593}, 
address={Washington, D.C.},
month = {November},
bib2html_pubtype = {Refereed Conference},
bib2html_rescat = {Design Methodology, Failure Analysis},
year = {2003}
}

Generated by bib2html.pl (written by Patrick Riley ) on Wed May 11, 2005 17:22:59