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Learning from failures: archiving and designing with failure and risk. M. VanWie, M. Bohm, R. Stone, I. Y. Tumer, and F. Barrientos. In Computer Aided Industrial Design and Conceptual Design Conference, Delft, Netherlands, May 2005.
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@inproceedings{vanwie05a, author ={M. VanWie and M. Bohm and R. Stone and I. Y. Tumer and F. Barrientos}, title ={Learning from failures: archiving and designing with failure and risk}, booktitle ={Computer Aided Industrial Design and Conceptual Design Conference}, address = {Delft, Netherlands}, month = {May}, bib2html_pubtype = {Refereed Conference}, bib2html_rescat = {Design Methodology, Failure Analysis}, year = {2005} }
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