Novel Materials and Devices Group
Electrical Engineering and Computer Science | Materials Science | Oregon State University

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Prof Conley

John F. Conley, Jr.
Professor
Electrical Engineering / Materials Science
ONAMI Signature Faculty Fellow
Co-Director, OSU Materials Synthesis and Characterization (MASC) Facility

Ph.D. ESM - Penn State University (1995)
B.S. EE - Penn State University (1991)

School of Electrical Engineering and Computer Science
3089 Kelley Engineering Center
Corvallis, OR 97331
Phone: (541)737-9874, email: jconley@ eecs.oregonstate.edu

Research Interests
Dr. Conley's current research interests include atomic layer deposition, metal/insulator/metal devices (MIM & MIIM tunnel diodes, RRAM / memristors, and MIM high-κ capacitors), internal photoemission (IPE), thin film transistors, electron spin resonance (ESR) identification of point defects that play a role in reliability and radiation induced instabilities in novel electronic materials, and directed integration of nanomaterials and devices. (See here for brief overview)

Biography

John F. Conley, Jr.  earned his B.S. in electrical engineering in 1991 and Ph.D. in engineering science and mechanics in 1995 from The Pennsylvania State University where he won a 1996 Xerox Prize for his Ph.D. dissertation. 

He was at Dynamics Research Corporation from 1995 to 2000 and at the Jet Propulsion Laboratory from 2000-2001, where he received an achievement award.  In 2001, he became a senior member of the technical staff at Sharp Laboratories of America (SLA) and from 2005-2007 was Leader of the Novel Materials and Devices Group.  In 2002-03, he served as an adjunct professor at the Vancouver campus of Washington State University.  Since 2007, he has been a full Professor and an ONAMI Signature Faculty Fellow at Oregon State University in both the School of Electrical Engineering and Computer Science and the Intercollege Materials Science Program.   

Dr. Conley has served as a guest editor for three special issues of IEEE Transactions on Device and Material Reliability and has served on the technical and management committees of the American Vacuum Society, the MRS Electronic Materials Conference, IEEE Nano, IEEE IRPS, the IEEE SOI Conference, and the IEEE Nuclear and Space Radiation Effects Conference, was technical program chair of the IEEE Microelectronics Reliability and Qualification Workshop, and general program chair of the IEEE International Integrated Reliability Workshop. He has authored or co-authored over 120 technical papers and over 130 additional conference presentations (including 15 invited).  He also holds twenty U.S. patents and has presented tutorial short courses on high-k dielectrics at two international conferences.  He is a senior member of IEEE.

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John F. Conley, Jr.: jconley@ eecs.oregonstate.edu, ph (541)737-9874, 3089 Kelley Engineering Center